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DeCS
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Descriptor English:
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Microscopy, Electron, Scanning Transmission
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Descriptor Spanish:
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Microscopía Electrónica de Transmisión de Rastreo
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Descriptor Portuguese:
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Microscopia Eletrônica de Transmissão e Varredura
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Synonyms English:
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Electron Microscopy, Scanning Transmission
STEM
Scanning Transmission Electron Microscopy
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Tree Number:
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E01.370.350.515.402.580.480
E05.595.402.580.480
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Definition English:
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A type of TRANSMISSION ELECTRON MICROSCOPY in which the object is examined directly by an extremely narrow electron beam scanning the specimen point-by-point and using the reactions of the electrons that are transmitted through the specimen to create the image. It should not be confused with SCANNING ELECTRON MICROSCOPY. |
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Indexing Annotation English:
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do not confuse with MICROSCOPY, ELECTRON, SCANNING nor with MICROSCOPY, ELECTRON, TRANSMISSION; since the techniques have different applications, do not interpret: if in doubt, use words of author
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History Note English:
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93
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Allowable Qualifiers English:
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Record Number:
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30656
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Unique Identifier:
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D017348
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Occurrence in VHL:
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Similar:
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DeCS
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